一种基于测试数据两维压缩的BIST新方案  

A new BIST technique based on two dimensional compression of test data

作　　者：刘军[1] 梁华国[1] 李扬[1] 

机构地区：[1]合肥工业大学计算机与信息学院,安徽合肥230009

出　　处：《合肥工业大学学报（自然科学版）》2006年第10期1215-1219,共5页Journal of Hefei University of Technology：Natural Science

基　　金：国家自然科学基金资助项目(90407008);安徽省自然科学基金资助项目(050420103);教育部留学回国人员科研基金资助项目(2004.527)

摘　　要：为压缩内建自测试(BIST)期间所需测试数据存储容量,提出了一种新的基于测试数据两维压缩的BIST方案。建议方案首先使用多扫描链相容及重排的方法对测试集进行宽度压缩,然后使用折叠计数器方案进行长度压缩,该建议方案的结构与标准的扫描设计是相容的;试验结果表明,与其他BIST方案相比,建议方案的测试数据存储容量和测试时间都大量减少。To reduce the storage volume of the test data during the built-in self-test（BIST）, a new BIST technique based on two dimensional compression of test data is presented. Compatible compression of multiple scan chains is carried out first and then reformation of the compressed test vectors is made by the folding counter so as to compress the test set width. Then the test set length is compressed by means of the folding counter technique. The proposed architecture is compatible with standard scan design. Experimental results show that smaller test data volume and less test application time can be achieved by the presented technique in comparison with previous BIST techniques.

关 键 词：内建自测试 测试数据压缩 折叠计数器 多扫描链 

分 类 号：TP206.1[自动化与计算机技术—检测技术与自动化装置]