基于测试片段间转移的低功耗BIST实现  

A Implement of Low Power BIST Based on Test Segment Transformation

作　　者：杨婷[1] 邝继顺[1] 

机构地区：[1]湖南大学计算机与通信学院,长沙410082

出　　处：《微处理机》2007年第2期8-10,13,共4页Microprocessors

基　　金：国家自然科学基金(60173042)

摘　　要：随机测试向量产生时,一大部分的测试功耗是由于那些无贡献的测试向量所引起的。文中提出了一种基于测试片段间的转移低功耗BIST结构,该结构采用有效测试向量片段间转移的方式,除去了由随机产生而对故障覆盖率没有贡献的无效向量,并把有效测试向量片段以消耗功耗最小原则依次送入被测电路,减少了测试时间,在硬件代价不高的基础上有效降低了测试功耗。In random testing environment, a significant amount of energy is wasted in the LFSR and in the CUT by useless patterns that do not contribute to fault dropping. This paper proposes a low power BIST structure based on test segment transformation. This structure uses a way of effective test segment transformation, eliminate inefficacy test vectors generated by random algorithm that have no contribution to fault coverage and send the effective test segments to the ruing the lowest power. This structure decreases test time and reduces test power with a low hardware cost.

关 键 词：内建自测试 测试向量片断 低功耗测试 

分 类 号：TP302[自动化与计算机技术—计算机系统结构]