半导体功率器件结温的实时测量和在线测量  

Real-Time and On-Line Measurement of Junction Temperature for Semiconductor Power Devices

作　　者：朱阳军[1,2] 苗庆海[1] 张兴华[1] Yang Lieyong 卢烁今[1] 

机构地区：[1]山东大学物理与微电子学院,济南250100 [2]School of Computer Engineering,Nanyang Technological University,Singapore639798 [3]Fab7,Chartered Semiconductor Manufacturing,Singapore738406

出　　处：《Journal of Semiconductors》2007年第6期980-983,共4页半导体学报（英文版）

基　　金：国家自然科学基金(No.60476039);国家留学基金委员会资助项目~~

摘　　要：克服了器件在大电流测试时温度系数测不准的难题,帮助国际标准完善了实时测量和在线测量结温的方法,即在加热的同时,不改变加热状况的情况下,直接把加热电流当作测量电流,借助于校准曲线从而测量出晶体管的结温.A new method for the real-time measurement of junction temperature is introduced. For transistors dissipating power at a constant rate, the heating current is treated as the measuring current in order to measure directly the junction tem-perature of the transistors. The method can be used in on-line measurements.

关 键 词：实时测量 结温 本底数据 

分 类 号：TN303[电子电信—物理电子学]