多功能半导体光电性质测试电路的设计  

Design of A Multi-functional Semiconductor Photoelectric Property Test Circuit

作　　者：黄炜[1] 越方禹[1] 马丽丽[1] 吕翔[1] 李宁[1] 邵军[1] 褚君浩[1] 

机构地区：[1]中国科学院上海技术物理研究所,上海200083

出　　处：《红外》2007年第8期11-15,共5页Infrared

摘　　要：设计了一个多功能半导体光电性质测试电路。配合红外光谱仪,该电路能完成相应波段的光电流谱测试。设计还加入了交流信号发生器功能,可用于半导体弱电场调制反射光谱测试,具有很高的应用价值。该电路在为半导体样品提供低噪声、高稳定性的电学测试环境的同时,也具备友好的人机交互接口,可实时地对测试条件进行控制和监视。文章分析介绍了电路系统中各个模块的硬件结构,并对设计中应用的两个主要芯片及其与单片机的接口电路进行了详细描述.A multi-functional semiconductor photoelectric property test circuit is designed. With the aid of an infrared spectrometer, it can be used to test the photocurrent in the corresponding waveband. Because an AC signal generator module is added in this circuit, it can also be used to test the modulated reflective spectrum of the weak electric field in semiconductor. So, it is of great value to application. Besides a low noise and highly stable electric test condition can be provided for the semiconductor samples, a user-friendly interface which can be used to control and monitor the test condition in real time is provided. The hardware structure of each module of this design is presented and two main chips and their interface circuits for single-chip processors are described in detail.

关 键 词：半导体 光电流谱 A/D转换 单片机 DDS 

分 类 号：TN307[电子电信—物理电子学] TN36