Laplace缺陷谱方法研究  

Investigation of Laplace Defect Spectroscopy Method

作　　者：詹华瀚[1] 康俊勇[1] 黄启圣[1] 

机构地区：[1]厦门大学物理系,厦门361005

出　　处：《Journal of Semiconductors》1997年第7期492-496,共5页半导体学报（英文版）

基　　金：国家及福建省自然科学基金

摘　　要：本文讨论了研究半导体缺陷深能级瞬态谱中遇到的多指数分解问题，并使用共轭梯度计算法对瞬态谱进行数值Laplace逆变换处理来实现多指数瞬态的分解．结果表明，此方法具有较高的分辨率，而且存储和计算量较小，适用于进行常规的深能级瞬态精细结构测量．The problem of decomposing a multiple exponential transient into its constituent parts in study of deep energy levels in semiconductors is discussed. To deconvolute a multiple exponential transient, conjugate gradient method is used to perform numerical inverse Laplace transform by a personal computer. The results show that this method is not only of high resolution, but also requires less memory and calculation, which is sui table for study of fine structure of deep level transient.

关 键 词：半导体缺陷 深能级 瞬态谱 

分 类 号：O474[理学—半导体物理]