平板显示器功率驱动芯片的Latch-up及克服方法  

Research on a Method of Latch-up Immunity in Power Driver IC of PDP

作　　者：易扬波[1] 孙伟锋[1] 宋慧滨[1] 唐晨[1] 

机构地区：[1]东南大学国家ASIC系统工程技术研究中心,南京210096

出　　处：《固体电子学研究与进展》2008年第2期253-257,共5页Research & Progress of SSE

基　　金：国家高技术研究发展计划(863)资助项目(2004AA1Z1060)

摘　　要：详细分析了平板显示器驱动芯片中的Latch-up现象,在此基础上采用了一种克服Latch-up的方法:在低压部分增加多子保护环,在高低压之间增加少子保护环。借助TCAD软件详细研究了少子环位置及宽度对抗Latch-up效果的影响。实验结果证明,采用该方法可以有效地克服功率集成电路的Latch-up现象。In this paper, an effective way to avoid the flat display panel latching up is proposed based on the TCAD simulation results. The presented way is： adding majority carrier guard rings near the low voltage circuit and adding minority carrier guard ring between the low voltage and high voltage circuits. The influence of the location and width of the minority carrier guard ring on the latch-up is also suggested by using Medici. The experimental results show the latch-up of the novel driver IC with the guarding rings is avoided.

关 键 词：驱动芯片 LATCH-UP 少子保护环 多子保护环 

分 类 号：TN386[电子电信—物理电子学] TN406