12位双极数模转换器高低剂量率的辐射效应  

Radiation effects of a 12-bit bipolar digital-to-analog converter under different dose rates

作　　者：王义元[1] 陆妩[1] 任迪远[1] 郑玉展[1] 高博[1] 李鹏伟[1] 于跃[1] 

机构地区：[1]中国科学院新疆理化技术研究所

出　　处：《核技术》2008年第9期685-688,共4页Nuclear Techniques

摘　　要：通过对12位双极数模转换器在60Coγ射线的高低剂量率的辐照实验和室温退火实验的对比分析,发现数模混合电路在不同剂量率辐照下的电离辐照响应有很大差异。这种混合电路不但表现出明显的低剂量率损伤增强效应,而且表现出时间相关效应。结合辐射响应测试过程和空间电荷模型,对其损伤模块和辐射损伤机理进行初步探讨。Total-dose effects and room-temperature annealing behavior of bipolar digital-to-analog converter （DAC） irradiated by ^60Co γ-rays were investigated. The results show that the response of the DAC is different between low- and high-dose-rote irradiation. It was found that the integrated circuits exhibit ELDRS and time dependence effect as well. Based on the space charge model, possible mechanism for this response is discussed.

关 键 词：数模转换器 辐射效应 室温退火 ELDRS 

分 类 号：TN431[电子电信—微电子学与固体电子学] TN792