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作 者:魏振忠[1] 侯亚荣[2] 高明[1] 张广军[1]
机构地区:[1]北京航空航天大学精密光机电一体化技术教育部重点实验室,北京100083 [2]北京工业大学计算机学院,北京100022
出 处:《红外与激光工程》2008年第4期739-742,共4页Infrared and Laser Engineering
基 金:教育部新世纪优秀人才支持计划项目(NCET-07-0043)
摘 要:针对多元红外探测器测试,提出了一种基于单元响应信号强度分布带中心线探测的元内均匀性自动测试扫描路径规划方法。利用精密六自由度移动台带动探测器敏感面,使红外小光点对其做二维扫描,可得到有标记元的输出信号强度二维带状分布图,该分布带的中心线方向即为被测元的长度分布方向。结合探测器敏感面的设计尺寸和元间几何拓扑关系,可实现各个元内均匀性自动测试扫描路径的规划,从而有效提高多元红外探测器元内均匀性测试的效率和准确性。An approach of path planning for inner-element uniformity auto-test of multi-element infrared detector was proposed based on a single element′s response to the infrared spot scanning,which formed the central line of the special distribution formed by the signal intensity. The method could be used to locate the element path. According to the alignment of infrared spot and the center of sensitive surface of multi-element infrared detector,the 2-dimension distribution of an element output signal intensity was obtained by infrared spot scanning on the sensitive surface which was on the mobile station of high precision 6-degree-of-freedom. The response signal intensity distribution was analyzed, a conclusion was that both the edge points of a response signal can be obtained through extremum of 3rd order derivative. Projecting the signal intensity distribution on to a 2-dimention image,the gray intensity of which was in accord with the signal intensity. Every order derivative of the projected signal could be easily obtained by convolution with 1st,2nd,and 3rd order derivative of Gaussian convolution kernel separately,while the edge points of each section was extracted. The center points can be calculated by arithmetic mean of two edge points,and the central line of the 2-dimensional distribution band can be fitted,which was also the scanned inner-element length direction. According to this direction and topology of elements,the auto scanning path for testing the inner-element uniformity was planned. Finally,an experiment was presented. Results show that the proposed approach advances the efficiency and accuracy of inner-element uniformity testing of multi-element infrared detector.
分 类 号:TN215[电子电信—物理电子学]
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