纯钛镀制TiSiN薄膜后与光固化冠桥树脂结合强度的研究  

Study of the bonding strength of pure titanium and light-cured hard crown and bridge composite after filming by TiSiN

作　　者：尹路 郭天文 于绍冰 越野 

机构地区：[1]第四军医大学口腔医院修复科,陕西西安710032

出　　处：《华西口腔医学杂志》2008年第4期368-370,共3页West China Journal of Stomatology

基　　金：国家自然科学基金资助项目(39770805)

摘　　要：目的在纯钛表面磁控溅射镀制不同Si量的TiSiN膜后,比较纯钛与光固化冠桥树脂Solidex的结合强度,并对其界面进行分析。方法制作3组纯钛试件,1组表面不作处理,另2组分别在不同硅质量分数(9%和19%)下应用磁控溅射设备涂层试样表面后烤塑,采用AGS万能材料试验机测试纯钛与Solidex的剪切结合强度,并应用电子探针显微分析仪和扫描电镜观察镀膜层-树脂界面的表面形貌和分析成分。结果镀膜组结合强度优于未镀膜组(P<0.05),镀膜组中提高的Si量增加了结合强度,镀膜组中形成致密非晶态TiN、SiN。结论纯钛表面经磁控溅射镀制不同Si量的TiSiN膜后烤塑可以增加界面结合强度。镀膜组中形成的致密非晶态TiN、SiN填补了金属基底与Solidex烤塑专用树脂可能存在的空隙,有助于阻止金属离子渗出。Objective To evaluated the bonding strength between pure titanium and Solidex after deposition by magnetron sputtering TiSiN with different content of Si （9%, 19%） and analyzed the surface component by electron probe micro-analysis （EPMA）. Methods All pure titanium samples divided into 3 groups according to different sur- face treatment, then bonded with Solidex light-cured composite. Material test machine was used to measure bonding strength and the surface was analyzed by EPMA. Results The bonding strength of deposition with TiSiN groups were higher than unfilming group, increasing the content of Si could enhance the bonding strength between pure titanium and Solidex in TiSiN groups （P〈0.05）. EPMA showed amorphous materials like TiN, SiN gathered on the surface in TiSiN groups. There were obvious interspaces between unfilming pure titanium and Solidex, contrary no interspaees was observed in TiSiN groups. Conclusion The bonding strength of filming groups was higher than unfilming group, amorphous material like TiN, SiN gathering on the surface may prevent the mieroleakage and stop metal ion leaking.

关 键 词：纯钛 磁控溅射 光固化冠桥树脂 

分 类 号：R783.1[医药卫生—口腔医学]