基于伪随机测试的模数混合信号内建自测试法  

Study of analog and mixed-signal circuit BIST based on pesudorandom testing

作　　者：刘伟[1] 雷加[1] 

机构地区：[1]桂林电子科技大学CAT研究室,广西桂林541004

出　　处：《计算机工程与应用》2008年第30期87-89,共3页Computer Engineering and Applications

基　　金：广西自然科学基金 No.0542050~~

摘　　要：利用伪随机序列作为测试激励,通过计算输入输出的互相关函数得到K维特征空间,在特征空间的基础上进行分析,判别电路有无故障,实验证明该方法简单可行,且提高了测试的效率和正确性,适用于模拟及混合信号测试,适用于混合信号电路的内建自测试(BIST)。Using pseudo-random sequence for testing stimulus,K-dimensional feature space can be obtained by calculating the cross-correlation function of input and output sequence.The Circuit Under Test （CUT） on the basis of feature space can be analyzed and estimated.h is proved that the method is simple and feasible,and it can increase the efficiency and accuracy of test. This method can be applied in the mixed-signal circuits test and in the Built-In Self-Test（BIST）.

关 键 词：伪随机测试 互相关函数 混合信号电路 内建自测试 

分 类 号：TN710[电子电信—电路与系统]