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机构地区:[1]电子科技大学自动化工程学院,四川成都610054 [2]中国测试技术研究院,四川成都610021
出 处:《中国测试技术》2008年第6期44-46,共3页CHINA MEASUREMENT & TESTING TECHNOLOGY
摘 要:针对LPC2136片内ADC的分辨率较低,不能满足测量精度的需要,而外接高分辨率的ADC成本又较高的情况,提出了采用过采样和求均值的方法增加LPC2136片内ADC的分辨率。基于过采样技术提高模数转换器ADC转换分辨率的基本原理及电路模型,给出了一个应用过采样技术增加LPC2136片内模数转换器ADC的分辨率转换结果的实现示例及其软件实现方法,并进行了温度实测实验,结果表明测量分辨率明显提高,能满足测量精度的需要。The low resolution of ADC in the LPC2136 couldn't meet the measuring requirement and the cost would be high if the high resolution ADC is used. In order to improve this situation, one way to improve the resolution of ADC in the LPC2136 has been proposed on the base of the oversampling technology and its circuit module. According to this, an implementation sample has been showed, which increase the ADC resolution of LPC2136 just with the oversampling technology and its circuit module. And also, the way to realize its corresponding software has been given. Furthermore, the temperature measurement experiment has been done with this method and the results show the measuring resolution is obviously improved and it could meet the requirements of actual measurements.
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