一种实用CMOS芯片开路和短路特性测试的新方法  

Practical New Method of CMOS Chip Open-Circuit and Short-Circuit Testing

作　　者：杨卫[1] 

机构地区：[1]苏州大学电子信息学院,江苏苏州215021

出　　处：《电工电气》2009年第9期50-53,共4页Electrotechnics Electric

摘　　要：IDDQ测试是一种新的集成电路测试方法和技术。这种测试是在多种输入逻辑条件下测试电路的静态电源电流参数值,它可以有效地检测出早期失效器件。介绍了一种新型的IDDQ开路和短路测试方法;利用模拟开关和简单的电流源并利用带A/D模块的MCU组成一个开路和短路测试电路。该方法既节省成本,又能实现简单的智能学习。IDDQ test is a new type of IC testing method and technology, which recently has drawn enormous attention from people in the industry at home and abroad. IDDQ test is intended to test the parameters of the static current in the power supply under the logic condition of multiple inputs. Meanwhile, it can effectively identify the inactive parts at early stage. This article introduced a new kind of IDDQ continuity test, using analog switches, simple current supplies and a microcontroller unit （MCU） with A/D to make up an open circuit and short circuit. This new method can not only help save costs, but also be used for intelligent learning.

关 键 词：IDDQ测试 微控制器 电流源 模拟开关 CMOS芯片 

分 类 号：TN43[电子电信—微电子学与固体电子学]