离子注入对绿豆种子的影响  

Effects of Ion Beam Irradiation on Seeds of Mung Bean (Phaseolus radiatus L.)

作　　者：蒋悟生[1] 刘东华[1] 李毅[2,3] 郭希铭[2,3] 郭淑华 

机构地区：[1]天津师范大学生物系 [2]天津师范大学物理系 [3]南开大学测试中心

出　　处：《华北农学报》1999年第1期57-62,共6页Acta Agriculturae Boreali-Sinica

基　　金：国家自然科学基金

摘　　要：以５０ｋｅＶＦｅ＋和Ｃｕ＋注入绿豆种子，应用扫描电镜和Ｘ－射线能谱分析法观察、分析低能重离子的注入对绿豆种子细胞形态的影响及注入离子的穿透能力。结果表明，Ｆｅ＋和Ｃｕ＋注入后的种皮表面细胞壁角质层被破坏，细胞表面呈现出许多孔洞；剥去种皮的子叶和胚根表面，细胞壁明显塌陷；注入离子可穿过种皮。The seeds of mung bean were irradiated by iron and copper ion beam with energy 50 keV.The effects on cellular morphology of the seeds were observed by a scanning electron microscope,and the irradiating ability of the ions was analyzed by means of a scanning energy dispersive analysis of X ray.The results showed that after the treatments with copper and iron ion beam irradiation,the cuticle layers of the cell wall in the surface of seed coat were destroyed,and the many holes existed in the cell surface;the cell wall was obviously subsided in the surface of cotyledon and the radicle with seed coat removed and that the ions could penetrate the seed coat and arrive in the embryo.

关 键 词：绿豆 离子注入 铁离子 铜离子 扫描电镜 

分 类 号：S522.03[农业科学—作物学]