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作 者:白小燕[1] 彭宏论[1] 林东生[1] 陈伟[1] 李瑞宾[1] 王桂珍[1] 杨善潮[1] 李斌[1] 郭晓强[1]
机构地区:[1]西北核技术研究所,西安710024
出 处:《核电子学与探测技术》2010年第9期1269-1274,共6页Nuclear Electronics & Detection Technology
摘 要:实验研究了两种型号(CJ79L05011和CJ7905011)的商用三端稳压器在不同负载情况下中子辐射效应,得到了输出电压随中子注量的变化曲线。借助三端稳压器的简化模型,分析认为中子辐射下晶体管放大倍数的减少是造成三端稳压器输出电压变化的关键因素,并理论推导了输出电压和晶体管放大倍数的关系,利用PSPICE软件进行了模拟仿真,结果表明理论曲线和实验现象是基本一致的。The neutron irradiation effect on Two types of commercial three-terminal regulators(CJ79L05011 and CJ7905011)worked under different loads was studied by experiment.And then the relationship between the output voltage of the regulators and the fast neutron flux was observed.It was predicted that the decrease of current gain of transistors resulting from the neutron radiation damage was the main cause for the failure of three-terminal regulators from the simplify model of the regulator.The relationship between the output voltage of the regulator and the current gain of transistors in the internal of the regulator was also deduced from the simplify model.At the same time,the relationship was calculated under the help of the software of PSPICE.The simulated results were in good agreements with experimental data.It has been proved that the analysis for the radiation damage in regulators by neutrons was right.
分 类 号:TN431.1[电子电信—微电子学与固体电子学]
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