粗检漏试验标准问题的研究及建议  

Investigation and Suggestion for Standard Problems of the Gross Leak Test

作　　者：宋玉玺[1] 李巍[1] 

机构地区：[1]国家半导体器件质量监督检验中心,石家庄050051

出　　处：《半导体技术》2010年第11期1099-1101,共3页Semiconductor Technology

摘　　要：有些外形较小或内腔腔体体积较小并且检漏合格的电子产品,进行水汽含量测定时有时会出现样品水汽含量超标现象。为证明现行国家标准中粗检漏试验方法(高温氟油加压检漏法)会对产品出现误判的问题,通过一系列试验和研究,证明了外形较小或内腔腔体体积较小存在漏孔的电子产品,严格按照现行的粗检漏试验方法中规定的样品在空气中干燥有效时间(2±1)min内进行试验,试验得到了多种结果,进而对产品形成误判,为此对标准中的该试验方法提出了一些新的建议。Some electronic devices with a tiny external volume or small internal cavities and ventages are eligible in leak test,but the devices are out of the limit in moisture content test.For the sake of proving that there might be a justice miscarriage in the high temperature perfluorocarbon gross leak test method in active national standards,a series of testing and investigations of electronic devices were carried out.And it was testified that some electronic devices with tiny external volume or small designed internal cavities and ventages got the different results after tested within effective time of（2±1）min in accordance with the actual perfluorocarbon gross leak test method. And this phenomenon may result in miscarriages of justice.In allusion to this problem,several suggestions were put forward.

关 键 词：粗检漏 干燥时间 标准 水汽含量 误判 

分 类 号：TN407[电子电信—微电子学与固体电子学]