PbS红外探测器的低频噪声特性研究  

Study on Low Frequency Noise of PbS Infrared Detector

作　　者：殷雪松[1] 杜磊[1] 陈文豪[1] 王芳[1] 彭丽娟[1] 

机构地区：[1]西安电子科技大学技术物理学院,陕西西安710071

出　　处：《红外技术》2010年第12期704-707,共4页Infrared Technology

摘　　要：PbS红外探测器的研究开始较早,由于其室温的优越性,至今应用仍很广泛。然而噪声严重影响了其性能,因此其噪声的研究目前很受重视。首先阐述了光导探测器的低频噪声理论;其次给出一简便而实用的PbS红外探测器低频噪声测量系统;最后在PbS红外探测器低频噪声实际测量和分析的基础上,分析了其低频噪声产生机理、偏压特性与温度特性,从而为改善器件质量提供了理论依据。PbS infrared detector has been investigated for a long time,and it has a wide application for its superior advantage at room temperature.However,noise dramatically limits its performance,so the research of its noise attracts many attentions.Firstly,this paper expound the low frequency noise theory of photo detectors,then a simple and practical low frequency noise measurement system of PbS infrared detector is presented.At last,the noise generation mechanism,the bias voltage and temperature characteristics are analyzed based on the measurement results.The result provides a theoretical background for improving the quality of the device.

关 键 词：低频噪声 1/f噪声 G-R噪声 产生机理 

分 类 号：TN215[电子电信—物理电子学]