一种ATE测试向量时序优化算法  

An Algorithm for Optimizing Timing of Test Vector in ATE

作　　者：陈辉[1,2] 姚若河[2] 王晓晗[1] 恩云飞[1] 魏建中[1] 

机构地区：[1]工业和信息化部电子第五研究所,广州510610 [2]华南理工大学,广州510641

出　　处：《微电子学》2011年第2期310-314,共5页Microelectronics

摘　　要：介绍了自动测试设备(ATE)测试信号合成的基本原理,讲述了ATE测试时序的结构和特点,分析了VCD(Value Change Dump)文件的语法结构和特点,提出了一种ATE测试时序优化算法,包括VCD时间沿的修剪和分辨率降低原则。经过时序优化算法处理的VCD文件,在进行测试向量转换时,生成的测试时序中,定时沿的数量得到有效控制,测试波形数量明显减少,避免了ATE定时沿数量和波形存储深度的物理限制,保证了测试向量转换后编译的成功率。同时,定时沿和测试波形数量的减少,不仅提高了测试向量转换效率,还缩短了测试程序调试(Debug)时间,达到了提高集成电路测试程序开发效率的目的。Principle of test signal synthesis in ATE was presented.Structure and characteristics of ATE test timing were described,and format of VCD file was analyzed.An algorithm for optimizing timing of ATE test vector was proposed,including algorithm of edge trimming and principle of timescale cut-down.After VCD file was optimized,edges were controlled and the number of test waveforms was reduced,which would avoid hardware limits of edges and waveforms in ATE,ensuring success rate of test vector compiler.With reducing test waveforms,the conversion efficiency was improved and the debug time was reduced,thus improving the efficiency of developing IC test program.

关 键 词：自动测试设备 集成电路测试 VCD文件 测试时序 测试向量 

分 类 号：TN406[电子电信—微电子学与固体电子学]