电子器件散粒噪声测试方法研究  

Shot noise measurement methods in electronic devices

作　　者：陈文豪[1] 杜磊[1] 庄奕琪[2] 包军林[2] 何亮[1] 陈华[1] 孙鹏[1] 王婷岚[1] 

机构地区：[1]西安电子科技大学技术物理学院,西安710071 [2]西安电子科技大学微电子学院,西安710071

出　　处：《物理学报》2011年第5期159-166,共8页Acta Physica Sinica

基　　金：国家重点基础研究发展计划(973计划)(批准号:2010CB631002)资助的课题~~

摘　　要：本文分析了超导量子干涉器(SQUID)和超导-绝缘-超导(SIS)约瑟夫森结散粒噪声测试方法的应用局限性,提出了常规器件的散粒噪声测试方案.针对常规电子器件散粒噪声特性,研究了噪声测试基本条件,并建立了低温测试系统.通过采用双层屏蔽结构和超低噪声前置放大器,实现了较好的电磁干扰屏蔽和极低的背景噪声.在10K温度下对常规二极管散粒噪声进行了测试,通过理论和测试结果对比分析,验证了测试系统的准确和可信性.The limitations to shot noise measurement methods based on superconducting quantum interference device（SQUID） and superconductivity-insulation-superconductor（SIS） Josephson junction are pointed out,and a method to measure the shot noises of conventional electronic devices is proposed.Shot noise characteristics of conventional electronic devices are analyzed,and then a low-temperature measurement system is established.By using a double-shielding construction and low noise preamplifier,the test system can achieve a good electromagnetic interference shielding and low background noise.The theoretical and the experimental results of shot noises in diodes at 10 K are in good agreement with each other.The accuracy and the credibility of measurement system are proved.

关 键 词：散粒噪声 电子器件 噪声测试 

分 类 号：TN911.4[电子电信—通信与信息系统]