一种高温单粒子效应测试系统的设计与实现  

A High Temperature Single Event Effects Test System Design and Implementation

作　　者：董攀[1] 范隆[1] 岳素格[1] 杜守刚[1] 郑宏超[1] 

机构地区：[1]北京微电子技术研究所,北京100076

出　　处：《微电子学与计算机》2011年第12期17-20,24,共5页Microelectronics & Computer

摘　　要：航天器件在空间环境中存在着单粒子效应,根据研究可知高温会提升单粒子效应的敏感性,因此为了更好地评估器件的抗辐射性能,有必要建立一套高温单粒子效应测试系统.通过建立高温单粒子效应测试系统,选择ASIC和SRAM进行高温测试实验,完成了电路高温下的单粒子效应检测,证明了温度提升单粒子效应敏感性的事实.There are Single event effects in the Aerospace devices working in the space environment.It shows that the high temperature could improve the sensitivity of the Aerospace devices according to the study,In order to better evaluate the radiation tolerance property of the device,it is necessary to establish a set of high-temperature single event effects test system.In this paper we establish a high-temperature single event effects test system and select ASIC device and SRAM device to perform single event effects test under high temperature,finally we find that high-temperature could improve the SEE sensitivity.

关 键 词：单粒子效应 线性能量传输 可编程逻辑 大规模集成电路 

分 类 号：TN4[电子电信—微电子学与固体电子学]