基于USB2.0的边界扫描测试控制器的设计  

The Boundary Scan Controller Design Based on USB2.0

作　　者：董涪鑫[1] 颜学龙[1] 

机构地区：[1]桂林电子科技大学电子工程与自动化学院,广西桂林541004

出　　处：《大众科技》2012年第3期18-20,共3页Popular Science & Technology

摘　　要：边界扫描测试技术是目前一种主流的可测性设计方法,它用特有的结构和检测方法克服了复杂数字电路板测试的技术障碍,深入研究了IEEE1149.1边界扫描标准,文章针对传统的边界扫描测试控制器的接口复杂度高,边界扫描测试控制器硬件复杂、成本高的缺点,提出了一种基于USB2.0接口的边界扫描测试控制器设计方案,设计USB接口电路及驱动程序;测试结果表明,该测试控制器产生的测试信号符合IEEE1149.1标准。同时该控制器具有硬件结构简洁,使用灵活,有较高的性价比的特点,有较好的应用前景。Boundary scan technology is a popular design-for-rest technology,which can overcome controllability of complex digital by means of embedding special boundary scan cells inside the circuits,in-depth study of IEEE 1149.1 boundary-scan-test standard,in order to solve these defects,which are high complexity of connector of boundary scan test controller,complexity of hardware and high cost of boundary scan test controller,a design of boundary scan controller proposal based on USB interface is presented and USB interface circuit and driver are designed.The test results show that the test signal generated by this test controller is fit for IEEE1149.1 standard.Meanwhile it has features of simple hardware structure,using conveniently and high quality-price-ratio,so it has good application prospects.

关 键 词：边界扫描测试控制器 IEEE1149.1 USB 

分 类 号：TN702[电子电信—电路与系统]