微波反射光电导衰减法测少子寿命演示实验  

Demonstration experiment of the minority carrier lifetime measurement based on the microwave reflected photoconductance decay method

作　　者：汪礼胜[1] 陈凤翔[1] 

机构地区：[1]武汉理工大学理学院物理科学与技术系,湖北武汉430070

出　　处：《物理实验》2012年第3期1-3,8,共4页Physics Experimentation

基　　金：武汉理工大学教学研究项目(No.2010062);湖北省教学研究项目(No.2010079)

摘　　要：采用微波反射光电导衰减法设计了测试少子寿命的演示实验装置.实验装置主要由脉冲激光源、微波发射接收和数据采集处理系统等部分组成.该实验可以直观地演示非平衡载流子随时间的衰减过程,定量给出少子寿命、扩散系数和扩散长度.A minority carrier lifetime demonstration device was designed based on the microwave reflected photoconductance decay method.The demonstration device constituted of pulse laser source,microwave transmitter and acceptor,and data collecting and processing system.Using the demonstration device,the decay process of non-equilibrium carriers was visually demonstrated,and the minority carrier lifetime,diffusion coefficient and diffusion length were calculated.

关 键 词：微波反射光电导 少子寿命 扩散长度 

分 类 号：TN307[电子电信—物理电子学]