基于双CCFL的玻璃缺陷检测技术研究  

Research on Inspection Technology of Glass Defect Base on Dual-CCFL

作　　者：金永[1] 魏博[1] 王召巴[1] 朱林泉[1] 杨继亮[1] 

机构地区：[1]中北大学 电子测试技术国家重点实验室,山西太原030051

出　　处：《中北大学学报（自然科学版）》2013年第1期66-69,共4页Journal of North University of China(Natural Science Edition)

摘　　要：针对浮法玻璃生产过程中产生的玻璃缺陷,提出了基于双CCFL的玻璃缺陷检测方法,在待检测玻璃上形成两个周期的光强呈正弦分布的光栅,采用透射式光路,线阵CCD采集匀速移动的玻璃缺陷图像.通过双阈值的图像分割方法,将缺陷图像进行二值化处理,利用对缺陷坐标的连通性判断和二值化数据的分布实现了缺陷大小的计算和缺陷类型的识别,测试结果表明,该方法的检测精度为0.1mm.The method of defect inspection was proposed aiming at the glass defects during float glass production.The transmissive optical path was designed,gratings＇ two-period sinusoidal light intensity were generated on the testing glass based on dual CCFL,and linear CCD collected the defects image with uniform velocity.The two-threshold segmentation algorithm was used for the binary processing of the defects image,and the calculation of defect size and the recognition of defect type were realized by judging the connectivity of the coordinates and the binary data.The results show that the accuracy of defects using this method is 0.1 mm.

关 键 词：双CCFL 玻璃缺陷检测 二值化 

分 类 号：TN911.7[电子电信—通信与信息系统]