基于折叠计算的多扫描链BIST方案  

A BIST Scheme for Multiple Scan Chains Based on Folding Computing

作　　者：梁华国[1] 李扬[2,3] 李鑫[2] 易茂祥[1] 王伟[2] 常郝[2] 李松坤[2] 

机构地区：[1]合肥工业大学电子科学与应用物理学院,合肥230009 [2]合肥工业大学计算机与信息学院,合肥230009 [3]江苏省南通商贸高等职业学校信息科,南通226000

出　　处：《计算机辅助设计与图形学学报》2013年第4期557-563,共7页Journal of Computer-Aided Design & Computer Graphics

基　　金：国家自然科学基金(61274036;61106037;61106038);教育部博士点基金(20110111120012);安徽省高校自然科学研究重点项目(KJ2010A280);江苏省高校"青蓝工程"项目(2010121312);合肥工业大学博士学位人员专项基金(2011HGBZ1291)

摘　　要：为了减少测试数据的存储需求并降低测试应用时间,提出一种以折叠计算为理论的多扫描链BIST方案.首先利用输入精简技术在水平方向上压缩测试集,确定相容扫描链,在测试过程中对相容扫描链中的数据进行广播;然后利用折叠计算理论对测试集进行垂直方向上的压缩,使得同一折叠种子生成的相邻测试向量仅有1位不同,且在测试过程中测试向量并行移入多扫描链.在ISCAS标准电路上的实验结果表明,该方案的平均测试数据压缩率为95.07%,平均测试应用时间为之前方案的13.35%.In order to reduce the storage requirements of test data and test application time, a BIST scheme based on the theory of folding computing is proposed for multiple scan chains. Firstly, test pattern is horizontally compressed using the input reduction technique, and so the compatible scan chains are designed for broadcasting test data during testing. Secondly, the test set is vertically compressed into a seed set based on the theory of folding computing, and so adjoining test vectors of the same folding seed only differ in one bit position and are shifted into multiple scan chains in parallel during testing. Experiment results on ISCAS benchmark circuits demonstrate the average test compression rate of the proposed scheme is 95.07%, and the average test application time is 13.35% of the previous scheme.

关 键 词：折叠计算 内建自测试 多扫描链 测试应用时间 

分 类 号：TP391.7[自动化与计算机技术—计算机应用技术]