基于测试性的电子系统综合诊断与故障预测方法综述  

Summary of integrated diagnostics and prognostics method based on testability for electronic system

作　　者：邓森[1] 景博[1] 

机构地区：[1]空军工程大学航空航天工程学院,西安710038

出　　处：《控制与决策》2013年第5期641-649,共9页Control and Decision

基　　金：国家自然科学基金项目(51201182);航空科学基金项目(20101996012)

摘　　要：故障诊断与预测技术是故障预测与健康管理(PHM)中的两大关键技术.依据电子系统的故障模式与机理,结合测试性设计分析理论,提出了一种基于测试性的电子系统综合诊断与故障预测方法框架.对国内外综合诊断与故障预测方法进行了分类与总结,从基于测试性的嵌入式诊断、基于信号处理的智能故障诊断、基于测试性的故障预测3个方面论述了电子系统综合诊断与故障预测方法.最后分析了制约电子系统综合诊断与故障预测的因素,并探讨了未来的发展趋势.Fault diagnosis and prognostics are key technologies in prognostics and health management（PHM）. By combining the design of testability with fault models and mechanism, the architecture of integrated diagnostic and fault prognostics based on testability is proposed. The current developed techniques and methods of integrated diagnostics and prognostics are classified and summarized. The methods of integrated diagnostics and prognostics are discussed from embedded diagnostics based on testability, intelligent fault diagnosis based on signal process, and fault prognostics based on testability in electronic system. Finally, the factors that constrain the developments of integrated diagnostics and prognostics in electronic system are analyzed and the developing trend is also discussed.

关 键 词：电子系统 测试性设计 综合诊断 故障预测 

分 类 号：TP273[自动化与计算机技术—检测技术与自动化装置]