基于IEEE 1500的数字SOC测试系统的设计与实现  

Design and Implementation of Digital SOC Test System Based on IEEE 1500

作　　者：陈寿宏[1] 颜学龙[1] 陈凯[1] 

机构地区：[1]桂林电子科技大学电子工程与自动化学院,广西桂林541004

出　　处：《计算机测量与控制》2013年第5期1140-1142,共3页Computer Measurement &Control

基　　金：国家自然科学基金项目(61102012);预研基金资助项目(51323XXXXXX)

摘　　要：IEEE 1500为核供应者与核应用者提供接口,可有效实现测试电路复用。简要分析IEEE 1500标准,包括核测试壳Wrapper及核测试语言(CTL)两者的结构和特点;论述基于IEEE 1500的数字SOC测试系统的总体设计目标,设计了测试系统的软硬件体系结构,并构建了测试系统;通过DEMO电路测试验证,系统可正确实现扫描链完备性测试、核功能内测试及核互连测试,表明系统工作稳定,通用性强。IEEE 1500 can be as an interface for the core supplier and the core applier and has been efficiently applied for the test circuit reuse. The IEEE 1500 has been introduced briefly which mainly including： Wrapper and Core Test Language （CTL）. The architecture of digital SOC test system is discussed. The test system is composed of the software and hardware. By test of the DEMO circuit, the test sys- tem can achieve the test of chain integrity, core function intest and core interconneetion. The test results show that the test system can work stably and efficiently.

关 键 词：IEEE 1500 SOC测试系统 

分 类 号：TP47[自动化与计算机技术]