基于可配置LFSR的低功耗确定性矢量生成技术的研究  

Low Power Deterministic Vectors Generation Research Based on Configurable LFSR

作　　者：李鹏[1] 颜学龙[1] 

机构地区：[1]桂林电子科技大学电子工程与自动化学院,广西桂林541004

出　　处：《微电子学与计算机》2013年第10期144-148,152,共6页Microelectronics & Computer

摘　　要：针对组合电路内建自测试过程中的功耗和故障覆盖率等问题,提出了一种能获得较高故障覆盖率的低功耗测试矢量生成方案.该方案先借助Atalanta测试矢量生成工具,针对不同的被测电路生成故障覆盖率较高的测试矢量,再利用插入单跳变测试矢量的方法以及可配置线性反馈移位寄存器生成确定性测试向量的原理,获得低功耗测试矢量.通过对组合电路集ISCAS’85的实验,证实了这种测试生成方案的有效性.A low power test vectors generation method with high fault coverage is presented in this paper, which aims at power dissipation and fault coverage in combinational circuits using BIST way. The proposed method firstly uses the vectors generation tool of Atalanta to generate the test vectors with high fault coverage, then achieves the low power vectors by utilizing the way of inserting the single switching activities vectors and the theory of configurable LFSR to generate the deterministic test vectors. Experimental results based on the ISCAS＇ 85 benchmark circuit vertify the effectiveness by using this method.

关 键 词：内建自测试 低功耗测试矢量 故障覆盖率 可配置线性反馈移位寄存器 

分 类 号：TN402[电子电信—微电子学与固体电子学]