降低最大距离测试码输入功耗研究  

Study on maximum distance testing with low power dissipation

作　　者：张鼎[1] 徐拾义[1] 

机构地区：[1]上海大学计算机工程与科学学院,上海200072

出　　处：《计算机工程与应用》2014年第8期31-34,107,共5页Computer Engineering and Applications

基　　金：国家自然科学基金(No.61076123)

摘　　要：伪随机测试在数字系统的故障测试中已经得到了多年的应用,但传统的伪随机测试存在着效率比较低的缺陷。针对该缺陷提出了在伪随机测试方法中引入测试码之间距离的概念。根据测试码之间距离越大,能检测到不同故障的数目概率也越大的假设,基于测试码之间距离的随机测试法(简称基于距离测试法)可以生成一组测试码序列。但是由于基于距离测试法所生成的测试码相邻间距离的变大,将造成相邻输入码之间的跳变次数增多,使得输入测试码时所需要的功耗急剧增大。针对该情况,提出对伪随机测试法生成的测试码输入顺序进行重新排序和调整的概念,从而达到降低测试功耗的最终目标。Random testing has been long employed for testing of faults in digital systems. However, there are some fatal defects of it due to its low efficiency in testing. Aiming at this problem, a new concept of distance between test patterns is proposed. It is known that the larger distance between two test patterns the more different faults can be detected by these two patterns. Therefore, a new pseudo-random testing is proposed earlier called distance based random testing which can be more efficient in testing than that of traditional one. On the other hand, since the distance between two patterns in this method is large enough so that the power dissipation of applying test sequence is greatly increased when testing. This paper is just to present a novel way of changing the order of test patterns in the sequence when applying the tests so as to reduce the power dissipation as much as possible to reach the objective of lowering the power dissipation in testing.

关 键 词：伪随机测试 最大距离测试 预定距离测试 低功耗测试 生成矩阵 

分 类 号：TP393[自动化与计算机技术—计算机应用技术]