基于多配置LFSR的测试生成结构设计  

Structure design of test pattern generator based on multi-configurable LFSR

作　　者：李鹏[1] 颜学龙[1] 孙元[1] 

机构地区：[1]桂林电子科技大学电子工程与自动化学院,广西桂林541004

出　　处：《计算机工程与科学》2014年第5期814-820,共7页Computer Engineering & Science

摘　　要：针对内建自测试技术中传统的测试生成故障覆盖率过低、硬件开销过大等缺点,提出了一种多配置LFSR的混合测试矢量生成结构,结构利用矩阵理论先后对随机性矢量和确定性矢量进行反馈网络的配置;针对确定性矢量的生成,提出了一种反馈配置解的寻优算法,在一定程度上减少了硬件开销,因结构生成的混合测试矢量可以同时检测出被测电路中的随机矢量可测性故障和抗随机性故障,进而保证了测试故障覆盖率。最后,通过实例和对几种综合基准电路的测试,验证了该方案的可行性。In Built-In Self-Test （BIST）, the fault coverage of traditional test generation is too low, and the hardware overhead is too large. To tackle these disadvantages, a multi-configurable LFSR struc- ture of hybrid test vector generation is proposed. In the structure, matrix theory is used to configure the feedback network for random vectors and deterministic vectors. For the deterministic vector generation, an optimization algorithm of feedback configuration solution is proposed so as to reduce hardware over- head. The hybrid test vectors generated by the structure can ensure the test fault coverage, which can detect random pattern detectable faults and random pattern resistant faults in circuit under test. At last, some examples and several synthesized reference circuits are used to verify the feasibility of our proposal.

关 键 词：内建自测试 混合测试矢量 多配置LFSR 配置向量优化 

分 类 号：TN402[电子电信—微电子学与固体电子学]