用VHDL实现虚拟数字集成电路的故障检测  

The study and realization on virtual testing digital IC chips in VHDL

作　　者：宋跃[1] 谭爱群[1] 李哲明[1] 李寿存[1] 

机构地区：[1]湖南湘潭师范学院物理与信息工程系,湖南湘潭411201

出　　处：《电测与仪表》2001年第9期15-18,31,共5页Electrical Measurement & Instrumentation

摘　　要：介绍以AlteraCPLD系列FLEX10K器件为虚拟载体,在Windows95/98下借助Delphi5.0实现人机交互界面,借助PC机的控制离线完成对常用TTL74和54系列、CMOS4000和4500系列、常用RAM、EPROM、部分CPU接口芯片的故障检测的VHDL设计原理和实现方法。In this paper,we introduce a testing instrument,which used the Altera CPLD FLEX10K device as the virtual carrier controlled by PC.By means of Delphi 5.0in Win-dows95/98,we can qualitatively test the malfunction of many kinds of chips away from the system such as the series of TTL74and TTL54,CMOS4000and CMOS4500,RAM,E-PROM,the some interface chips of CPU etc.The instruments' VHDL design principle and realizing method are also given.

关 键 词：虚拟仪器 人机交互界面 引脚智能选控 测试数据库 智能测试 数字集成电路 VHDL 

分 类 号：TN431.2[电子电信—微电子学与固体电子学]