基于后驱动技术的故障注入方法研究  

Back driving based fault Injection method

作　　者：李璇君[1] 辛季龄[1] 

机构地区：[1]南京航空航天大学动力工程系,江苏南京210016

出　　处：《哈尔滨工业大学学报》2001年第6期858-862,共5页Journal of Harbin Institute of Technology

摘　　要：作为评价数字电路系统 (例如 :航空电子综合系统 /发动机数控系统 )内建自测试 (builtintest—BIT)的有效手段 ,故障注入技术成为当前评价数字系统可靠性的关键技术之一 .在综合分析当前各种数字电路的硬件注入方法的基础上 ,特别是在总结自行研制的故障注入系统的基础上 ,提出一种方便、灵活既适用于具有BIT功能数字电路系统的研制阶段 ,又适宜于正式产品例行检测的故障注入方法———基于后驱动技术的故障注入 .为避免后驱动技术有可能对元器件造成损害 ,参考英国军方后驱动安全容限标准 ,设计出安全、可靠的后驱动故障注入实现电路及系统 .As an efficient method in evaluating the efficiency of Build in Test (BIT) in digital circuit systems Such as: the Integrated System of Avionics/Aeroengine Digital Control System, fault injection technology is one of the key techniques in evaluating the reliability of digital systems. Based on our detailed analyses of hardware fault injection methods of nowadays various digital circuits, especially on self researched and developed fault injection system, a new kind of fault injection method-Back Driving based Fault injection method is introduced. This kind of fault injection method can be easily used not only in the research and developed stage of digital circuit systems which have the function of BIT but also in the regular inspection of real products. In order to avoid the probable damage to the element and component caused by the Back Driving technique, safe and reliable realizing circuits and system of Back Driving fault injection have been designed with reference made to U.K. military standard.

关 键 词：数字电路 内建自测试 故障注入 后驱动 航空电子系统 BIT 

分 类 号：V243[航空宇航科学与技术—飞行器设计] TP331.2[自动化与计算机技术—计算机系统结构]