表面光电压谱(SPS)在有机半导体材料研究中的应用  

The application of the surface photovoltage spectroscope in the organic semiconductor

作　　者：曹健[1] 汪茫[1] 孙景志[1] 周雪琴[1] 

机构地区：[1]浙江大学高分子科学与工程系

出　　处：《功能材料》2002年第3期231-233,共3页Journal of Functional Materials

基　　金：国家自然科学基金资助项目 (69890 2 30 ;50 0 730 1 8)

摘　　要：简要介绍了表面光电压谱 (SPS)的几种常用测试方法和测试原理 ,通过典型实例说明了SPS技术在研究有机半导体电子结构、有机半导体薄膜的光电性能与制备方法的关系、半导体异质结性能等方面的应用。评述了SPS技术在研究酞菁氧钛 /偶氮绿丹蓝复合材料的光电性能中发现的光伏极性反转新现象。This review briefly described a few accessible technique of surface photovoltage spectroscope (SPS) and their working principles. Based on prototype examples, it outlined the application of SPS technique in investigating the photoelectric structure of organic semiconductors, in the relationship between the optical-electronic properties and thin film fabrication methods, and in researching the heterojunctions formed by different semiconductors. A novel phenomenon of photovoltaic polarity inversion (PVPI) found in studying the photoconductive property of titania phthalocyanine (TiOPc)/chloridian blue (DBCL) composites was introduced. We also point out the prospect on the promising application of SPS in studying the optoelectronic properties of organic semiconductors.

关 键 词：表面光电压谱 有机半导体 电子态 

分 类 号：TN304.5[电子电信—物理电子学] O472[理学—半导体物理]