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机构地区:[1]兰州大学微电子所,兰州730000
出 处:《电子器件》2014年第6期1026-1029,共4页Chinese Journal of Electron Devices
基 金:甘肃省科技支撑计划项目(1204GKCA062)
摘 要:为了弥补传统肖特基二极管漏电流大和反向耐压低的不足,采用栅条P+-N结和肖特基结嵌套形成结势垒肖特基二极管(JBS),终端结构由7道场限环和1道切断环构成。通过模拟确定最优参数后流片试验,同步制备肖特基二极管(SBD)和Pi N二极管作为对比。结果表明:制备的JBS二极管兼备SBD二极管正偏和Pi N二极管反偏的优点。在漏电流密度小于1×10-5A/cm2时,反向耐压达到600 V;正向电流10 A(80.6 A/cm2)时,导通压降仅为1.1V。To compensate the high leakage current and low reverse breakdown voltage of conventional Schottky diode,a JBS diode structure was formed by combining strip P+-N junction grids and Schottky junction,which terminated by seven floating field limiting rings( FGRs) and one cutoff ring structure. Simulation was utilized to determine the optimized parameters in fabrication,SBD and Pi N diode were fabricated as contrast. The results showed that JBS diodes behave similar to SBD diodes in the on-state while reverse characteristics similar to Pi N diodes. The obtained JBS diodes were capable of blocking up to 600 V when the leakage current density was less than 1 × 10^-5A/cm^2,and the forward voltage drop at a current density of 80. 6 A/cm^2 is 1. 1 V
关 键 词:肖特基二极管 结势垒肖特基二极管 栅条结构 场限环 反向耐压600 V
分 类 号:TN315.2[电子电信—物理电子学]
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