集成电路测试系统总定时精度自动校准程序设计  

Automated Calibration Program Design of Overall TimingAccuracyof Automated Test Equipments

作　　者：刘倩[1] 胡勇[1] 李轩冕[1] 

机构地区：[1]武汉数字工程研究所,武汉430205

出　　处：《计算机与数字工程》2015年第1期29-31,69,共4页Computer & Digital Engineering

摘　　要：在高速集成电路测试应用中,当集成电路测试系统驱动或测量某一信号时,其驱动沿或比较沿与预期时间产生1ns的偏差都将导致整个测试时序严重偏离,使测试结果失去意义。系统总定时精度(OTA)就是反映测试系统提供的信号驱动或比较沿是否在预期的时间范围内,各信号之间的相对时间是否准确的关键时间参量,必须进行校准保证其溯源性。论文以V93000集成电路测试系统为例,介绍了集成电路测试系统总定时精度自动校准程序的设计方法。In the case of high speed integrated circuits testing,when Automated Test Equipments（ATEs）drive or measure a certain signal,even 1ns differential from the anticipated time would cause significant deviation in the entire timing,which leaves testing results meaningless.Overall Timing Accuracy（OTA）is the key timing parameter reflecting the accuracy of driven or measured signals.It is essential to make sure its traceability by calibration.This paper presents a method for automated calibration program design of OTA of ATEs based on V93000.

关 键 词：集成电路测试系统 总定时精度 校准 

分 类 号：TN492[电子电信—微电子学与固体电子学]