基于差错传播概率矩阵的时序电路软错误可靠性评估  

Reliability Estimation for Soft Error of Sequential Circuit Based on Error Propagation Probability Matrix

作　　者：蔡烁[1,2] 邝继顺[1] 张亮[1] 刘铁桥[1] 王伟征[2] 

机构地区：[1]湖南大学信息科学与工程学院,长沙410082 [2]长沙理工大学计算机与通信工程学院,长沙410004

出　　处：《计算机学报》2015年第5期923-931,共9页Chinese Journal of Computers

基　　金：国家自然科学基金(61303042;60773207;61472123);湖南省教育厅科研基金(14C0028)资助~~

摘　　要：在深亚微米及纳米级集成电路设计过程中,电路的可靠性评估是非常重要的一个环节.该文提出了一种基于差错传播概率矩阵(Error Propagation Probability Matrix,EPPM)的时序电路软错误可靠性评估方法,即先将逻辑门和触发器在当前时钟周期对差错的传播概率用4种EPPM表示,再利用自定义的矩阵并积运算计算多周期情况下的差错传播概率,最后结合二项分布的特点计算时序电路的可靠度.用ISCAS’89基准电路为对象进行实验,结果表明所提方法是准确和有效的.Reliability estimation of logical circuit is becoming an important feature in the design process of deep submicron and nanoscale systems. In this paper, a reliability estimation method for soft error of sequential circuit based on EPPM is proposed. The error propagation probability of logic gates and flip-flops in current clock cycle is represented with four EPPMs, then the error propagation probability in multicycle is calculated by customized matrix union operation. Considering the characteristics of the binomial distribution, the reliability of sequential circuit is estimated. Experimental results on ISCAS＇89 benchmark circuits show that our method is accurate and efficient.

关 键 词：软错误 时序电路 差错传播概率矩阵 并积运算 二项分布 

分 类 号：TN406[电子电信—微电子学与固体电子学]