典型石英钟振的电离辐射效应  

Ionizing radiation effects on typical clock oscillator

作　　者：刘伟鑫[1] 李珍[1] 肖寅枫 吾勤之[1] 王昆黍[1] 宣明[1] 

机构地区：[1]上海航天技术研究院第八〇八研究所,上海201109

出　　处：《辐射研究与辐射工艺学报》2015年第3期59-64,共6页Journal of Radiation Research and Radiation Processing

摘　　要：利用60Coγ-射线源研究宇航用典型石英钟振及其内部SM5009型振荡电路的电离辐射效应,测试辐照条件下钟振输出信号幅度、电源和电流等参数变化情况,分析这些参数变化与振荡电路失效之间的关系。结果表明,辐照条件下SM5009的场氧漏电较为严重,受照剂量达1500 Gy(Si)时,其漏电流增大至10-4A量级,这是导致辐照条件下钟振功耗电流增大的主要原因。同时SM5009的输出高电平对受照剂量较为敏感,当受照剂量达1500 Gy(Si)时,输出高电平下降约0.5 V,导致钟振输出信号峰峰值随受照剂量的增加而下降。Ionizing radiation effects of typical clock oscillator and its internal oscillator circuit SM5009 for satellite was studied by ^60Coγ-rays in this thesis. Output signal amplitude and supply current of clock oscillator were measured under irradiation conditions. Relationship between the change of these parameters and the failure of SM5009 oscillator circuit was also analyzed. The results showed that the field oxygen parasitic leakage of SM5009 was very severe under irradiation, and the leakage current could increase to 10-4 A when the absorbed dose accumulated to 1500 Gy（Si）. It was a significant reason that caused the supply current of clock oscillator increase. Meanwhile the high level of output voltage was sensitive to absorbed dose for SM5009. The high level of output voltage decreased for 0.5 V when the absorbed dose accumulated to 1500 Gy（Si）. This was an important reason that caused the output signal amplitude of clock oscillator decrease.

关 键 词：钟振 电离辐射效应 振荡电路 

分 类 号：TN45[电子电信—微电子学与固体电子学] TL81[核科学技术—核技术及应用]