DS18S20Z数字温度传感器在空间探测中的应用研究  

Study on Application of Digital Temperature Sensor DS18S20Z in Space Exploration

作　　者：张飞[1] 禹金标 董亦凡[1] 张云龙[1] 周大卫[1] 吴帝 龚柯[1] 樊瑞睿[1] 彭文溪[1] 王焕玉[1] 吕运朋[2] 

机构地区：[1]中国科学院高能物理研究所,北京100049 [2]郑州大学物理工程学院,郑州450001

出　　处：《核电子学与探测技术》2015年第5期495-499,共5页Nuclear Electronics & Detection Technology

基　　金：中国科学院空间先导专项暗物质粒子探测卫星硅探测器研制基金(XDA040402)

摘　　要：比较了热敏电阻和DS18S20Z的温度测量原理。介绍了在暗物质空间探测卫星系统中DS18S20Z数字温度传感器的应用方法。实验测试了DS18S20Z的单粒子闩锁和单粒子翻转特性,设计了防闩锁保护电路。实验选取了防闩锁电路参数并验证了防闩锁电路的有效性,讨论了单粒子翻转数据识别和剔除方法。根据暗物质卫星在轨运行时温度测量的需求,实验测试了400余万次断电对DS18S20Z性能的影响。实验结果表明防闩锁电路和翻转数据识别剔除方法有效可行;断电损伤测试结果表明多次断电不会影响DS1gS20Z性能。This paper compares the temperature measurement principle between thermistor and digital temperature sensor DS18S20Z. The application method of DS18S20Z in the system of dark matter space exploration satellite is introduced. The paper tested the characteristics of single event latch - up and Single Event Upset, designed the latch - up protection circuit. The parameters were chosen and the effectiveness of the protection circuit was verified by experiment. The methods to identify and remove SEU data were discussed. The experiments tested the influence of more than four million times power outages on DS18S20Z according to the requirement of temperature measurement when the dark matter satellite is in orbit. The experiments show that the prevention circuits and SEU data processing methods are effective and feasible. The test results show that repeated power outages will not affect the performance of DS18S20Z.

关 键 词：空间探测 热敏电阻 DS18S20Z 单粒子效应 闩锁保护电路 

分 类 号：V19[航空宇航科学与技术—人机与环境工程]