基于PID自校准算法的IGBT温升控制实现  

IGBT Temperature Control Based on Self-calibration PID

作　　者：张小玲[1] 陈君[1] 谢雪松[1] 张博文[1] 熊文雯[1] 任云[1] 袁芳[1] 

机构地区：[1]北京工业大学电子信息与控制工程学院,北京100124

出　　处：《北京工业大学学报》2016年第7期989-993,共5页Journal of Beijing University of Technology

基　　金：国家自然科学青年基金资助项目(61204081)

摘　　要：针对功率循环实验中绝缘栅双极型晶体管(insulated gate bipolar transistor,IGBT)温度过冲和滞后问题,设计了一种自校准PID算法控制IGBT温升.通过MATLAB进行PID建模及参数仿真,采用电学法测试原理并结合嵌入式系统测试IGBT结温,使用PID自校准算法控制器件温升进行IGBT热疲劳测试.实验结果表明:该算法的调节方式和温度精度都达到理想的效果,改善了系统的动态性能,为IGBT寿命预测提供了一个良好的实验环境.In order to solve the problem of IGBT temperature overshoot in power cycle test, a self-calibration PID algorithm was designed. PID controller was simulated by MATLAB. IGBT Junction temperature was tested by electrical testing theory and combined with embedded system. The self-calibration PID algorithm was applied to control IGBT junction temperature in thermal fatigue test. Experimental results show that both the self-calibration PID control and temperature can achieve better result. Thus system dynamic performance was improved much. It provided a better experimental environment for the IGBT life prediction.

关 键 词：自校准PID 电学法 结温 

分 类 号：TP308[自动化与计算机技术—计算机系统结构]