基于概率转移矩阵的全加器可靠性分析  

Reliability Analysis of the Full Adder Based on the Probabilistic Transfer Matrix

作　　者：张永强[1] 解光军[1] 吕洪君[1] 

机构地区：[1]合肥工业大学电子科学与应用物理学院,合肥230009

出　　处：《微纳电子技术》2016年第8期493-502,526,共11页Micronanoelectronic Technology

基　　金：国家自然科学基金资助项目(61271122)

摘　　要：基于量子元胞自动机(QCA)电路,通过贝叶斯网络(Bayesian network,BN)对7种不同的传输线建模,研究了基本传输线的输出正确率随温度的变化规律。另外,通过概率转移矩阵(PTM)研究了7种不同结构的全加器的整体可靠性和输出Si以及进位输出Ci+1的平均输出错误率随错误因子的变化规律,并研究了各器件单元对全加器整体可靠性的影响。仿真结果表明,对于只有1个元胞宽度的传输线,直线型传输线有最高的可靠性,而且通过增加传输线的宽度可以提高传输线的可靠性。电路的可靠性不仅与电路结构有关,而且与电路器件单元的类型和门的数量密切相关。而且,产生进位输出Ci+1的择多门对电路的整体可靠性的影响最大,但不同的全加器的进位输出有相同的可靠性。Based on the quantum-dot cellular automata（QCA）circuit,7 different types of wires were modeled by Bayesian network（BN）to investigate the variation rule of the output accuracy of the fundamental wire with the temperature.Moreover,the overall reliability of the full adders with 7 different structures and the variation rule of the average output error probability of the output Siand carry output Ci＋1with the error factor were studied by the probabilistic transfer matrix（PTM）.Besides,the effect of each device unit on the overall reliability of the full adder was researched.The simulation results show that the straight wire has the highest reliability for the wires with the width of only one cell,and the reliability of the wire can be improved by increasing the width of the wire.In addition,the reliability of the full adder relates to the layout of the circuit,and meanwhile is closely bound up with the kinds of the device units and the number of gates.The majority gate generating the carry out Ci＋1imposes the greatest effect on the overall reliability of the circuit compared with other components,while different carry output Ci＋1＇s have the same reliability for different full adders.

关 键 词：量子元胞自动机(QCA) 可靠性 贝叶斯网络(BN) 概率转移矩阵(PTM) 全加器 

分 类 号：O471.1[理学—半导体物理] TN4[理学—物理]