一种便携式VDMOS单粒子试验测试系统  

A portable test system of VDMOS SEE

作　　者：魏亚峰[1] 滕丽[1] 温显超[1] 俞宙[2] 

机构地区：[1]中国电子科技集团公司第24研究所,重庆400060 [2]模拟集成电路重点实验室,重庆400060

出　　处：《太赫兹科学与电子信息学报》2016年第5期816-819,824,共5页Journal of Terahertz Science and Electronic Information Technology

摘　　要：设计了一种在线测试系统,用于监测垂直双扩散金属-氧化物半导体场效应晶体管(VDMOS)器件在单粒子试验中的单粒子效应。简述了实验原理,从偏置设计与波形获取及仪器控制与远程监测多个方面详细论述了测试系统的硬件结构;给出了软件的设计流程及测试系统的操作界面。最后应用该自动测试系统开展了试验,结果表面该系统稳定可靠,便携易用。One online test system is designed to monitor Single Event Effect（SEE） of Vertical Double-diffusion Metal Oxide Semiconductor（VDMOS） Field Effect Transistor（FET） device. The hardware structure of the test system is described in detail from the aspects of the design of the offset, the acquisition of the waveform, the control and the remote monitoring after briefly introducing the experimental principle. Then the design flow of the software and the operating interface of the test system are given. In the end, experiment is completed by using the automatic test system, and the results are obtained. It is proved that the system is stable, reliable, portable and easy to use.

关 键 词：垂直双扩散金属-氧化物半导体场效应晶体管 单粒子效应 单粒子烧毁 测试系统 

分 类 号：TN386[电子电信—物理电子学]