修正飞针测试系统测试点坐标的解决方法  

Correction Method of Test Point Coordinate for Flying Probe Tester

作　　者：左宁[1] 高慧莹[1] ZUO Ning GAO Huiying(The 45th Research Institute of CECT, Beijing 100176, China)

机构地区：[1]中国电子科技集团公司第四十五研究所,北京100176

出　　处：《电子工业专用设备》2017年第5期36-40,45,共6页Equipment for Electronic Products Manufacturing

摘　　要：飞针测试系统是用来测量混合电路板、LTCC基板、PCB板的各网络间开路、短路、绝缘以及电容的专业电子芯片检测设备。针对飞针测试系统中测试坐标点的修正提出了一种解决方法,不仅能准确得出对待测基片的平移偏距,也能够通过算法计算出待测基片的旋转角度,综合考虑平移和旋转这两点的因素最终确定待测点的实际位置坐标。Flying probe test system is used to measure the network hybrid circuit board, LTCC board, PCB board of the open circuit and insulation and capacitance of professional electronic chip testing equipment This paper presents a method to solve the coordinate point correction test flying probe test system, not only can get accurate measurement of substrate offset translation treatment, can also be calculated by the algorithm to measure the rotation angle of the substrate, considering the translation and rotation of these two eventually determine the actual position coordinates of the measured point the.

关 键 词：飞针测试系统 坐标修正 平移偏距 旋转角度 

分 类 号：TN407[电子电信—微电子学与固体电子学]