教学型椭偏仪测量各向异性单轴晶体光学参数的方法研究  

A NOVEL METHOD TO MEASURE THE OPTICAL PARAMETERS OF ANISOTROPIC UNIAXIAL CRYSTALS WITH TEACHING ELLIPSOMETRY

作　　者：张锁歆 钱建强[1] 郝维昌[1] 秦雨浩 姚星群 ZHANG Suoxin;QIAN Jianqiang;HAO Weichang;QIN Yuhao;YAO Xingqun(School of Physic and Nuclear Energy Engineering,Beihang University,Beijing 100191)

机构地区：[1]北京航空航天大学物理科学与核能工程学院,北京100191

出　　处：《物理与工程》2018年第3期86-90,共5页Physics and Engineering

摘　　要：椭偏仪是一种常用的现代光学测量仪器,在物理实验教学中常用于测量各向同性材料的折射率、表面薄膜厚度等光学参数。本文提出一种利用教学型椭偏仪测量各向异性单轴晶体折射率等光学参数的方法。采用多入射角的方法增加系统自由度,建立数值反演模型,获得各向异性单轴晶体光学参数,并实验测量了钒酸钇晶体的折射率等光学参数。使用教学型椭偏仪测量各向异性单轴晶体光学参数,拓展了原有教学仪器的实验范围,有助于激发学生对实验的兴趣。The ellipsometry is an idealized tool to measure the optical parameters based on the phenomenon that linearly polarized light convert to elliptically polarized light after reflecting by the sample.However,the ordinary ellipsometry used for teaching commonly only applies to the isotropic crystal in the process of physics experiment teaching.This paper proposes a novel method that the optical parameters of anisotropic uniaxial crystals can be measured with the teaching ellipsometry.The system＇s degrees of freedom is increased by increasing the number of angle of incidence,and experimental data inversion model is established.Moreover,the experimental results of the yttrium vanadate crystals validate this method＇s correctness.This method expands the application range of the existing teaching equipment,and it will be valuable for enhancing students＇ experimental interest.

关 键 词：椭偏仪 各向异性晶体 光学参数 折射率 

分 类 号：G642[文化科学—高等教育学] O43-4[文化科学—教育学]