基于输入向量控制和传输门插入的电路NBTI老化缓解  

Mitigation of circuit NBTI aging based on input vector control and transmission gate insertion

作　　者：胡林聪 易茂祥[1] 丁力[1] 朱炯[1] 刘小红[1] 梁华国[1] HU Lincong;YI Maoxiang;DING Li;ZHU Jiong;LIU Xiaohong;LIANG Huaguo(School of Electronic Science and Applied Physics,Hefei University of Technology,Hefei 230009,China)

机构地区：[1]合肥工业大学电子科学与应用物理学院,安徽合肥230009

出　　处：《合肥工业大学学报（自然科学版）》2018年第1期55-59,75,共6页Journal of Hefei University of Technology：Natural Science

基　　金：国家自然科学基金资助项目(61371025;61474036;61574052)

摘　　要：针对现有方案通过输入向量控制(input vector control,IVC)结合门替换(gate replacement,GR)技术缓解负偏置温度不稳定性(negative bias temperature instability,NBTI)引起的电路老化,存在GR应用可能破坏IVC抗老化效果的问题,文章提出了一种基于IVC和传输门(transmission gate,TG)插入的抗NBTI老化方案。将目标电路切分为多个逻辑锥子电路,然后对各子电路进行动态回溯得到其最优输入控制向量,在恢复各子电路的连接时,通过插入TG消除连线位置出现的逻辑冲突,最后得到由子电路合并后的目标电路的最优输入控制向量。采用相同条件的实验结果表明,与现有方案相比,本文方案提高了电路平均时延退化改善率超过1倍,且面积开销和电路固有时延也明显降低,更好地缓解了电路老化效应。The input vector control(IVC)and gate replacement(GR)technique has been used to mitigate circuit aging caused by negative bias temperature instability(NBTI),but it will destruct the optimization results based on IVC after GR.In this paper,a new IVC and transmission gate(TG)insertion technique is proposed to minimize the NBTI-induced degradation.By this technique,the target circuit is divided into several sub-circuits liked logic cone.And the optimal input vector of these sub-circuits is searched by dynamic backtracking algorithm.Then these sub-circuits are connected and TG will be inserted if there is logic conflict in some connection lines.Finally,the optimal input vector of the target circuit combined by sub-circuits is obtained.Experimental results show that under the same experimental conditions,the average delay improvement rate of circuits more than doubles,the area penalty and the intrinsic delay is also reduced significantly by the proposed method compared with the IVC and GR technique.Therefore,the circuit aging is mitigated better.

关 键 词：负偏置温度不稳定性(NBTI) 老化 输入向量控制(IVC) 传输门(TG)插入 回溯 

分 类 号：TN407[电子电信—微电子学与固体电子学]