pH值对还原氧化石墨结构及电容性能的影响  

Influence of pH on Structure and Capacitance of Reduced Graphite Oxide

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作  者:杨芳[1] 刘晨 杨绍斌[1] 徐健博[1] 沈丁[1] Yang Fang;Liu Chen;Yang Shaobin;Xu Jianbo;Shen Ding(College of Material Science and Engineering,Liaoning Technical University,Fuxin,Liaoning 123000)

机构地区:[1]辽宁工程技术大学材料科学与工程学院,辽宁阜新123000

出  处:《非金属矿》2018年第5期1-3,共3页Non-Metallic Mines

基  金:国家自然科学基金(512741191)

摘  要:以天然鳞片石墨为原料,利用改进的Hummers法制备氧化石墨(GO),再将GO经超声分散,在不同pH值条件下采用抗坏血酸进行还原,制备得到还原氧化石墨(r GO)。采用SEM、XRD、恒流充放电测试分析p H值对样品的微观结构和电容性能的影响。结果表明:所得样品为片层结构,层间距为0.348~0.366 nm。随着GO溶液pH值的增加,材料的首次放电容量和循环性能都呈现先增大后减小的趋势。在pH值为9的情况下,rGO的比电容量为141.6 F/g,经过500次循环,样品容量保持率仍能达到88%。The graphite oxide(GO)was prepared by the modified Hummers method with purified natural flake graphite as raw material.Then GO was dispersed by ultrasonic,and ascorbic acid was used for reduction under different pH conditions to prepare rGO.The samples were characterized by using SEM,XRD and constant current charge and discharge test to analysised different pH values on the microstructure and capacitive performance of samples.The results showed that the samples had layer structure,and the layer spacing of graphene was 0.348 to 0.366 nm.With the increase of the pH value of GO,the first discharge specific capacitance and cycle performance of samples first increased and then decreased trends.In the case of a pH of 9,the rGO capacity was 141.6 F/g,and after 500 cycles,the sample capacity retention rate can still reach 88%.

关 键 词:氧化石墨 抗坏血酸 PH值 电容性能 

分 类 号:TM53[电气工程—电器]

 

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