饰品银含量和覆盖层厚度的X射线荧光检测  

Testing of Silver Content and Coating Thickness of Jeweler by X-ray Fluorescence Spectrometer

作　　者：吴奕阳[1] 杨鹔 黄国芳[1] WU Yiyang;YANG Su;HUANG Guofang(National Center of Quality Supervision&Inspection On Gold-Silver Products(Shanghai),Shanghai Institute of Measurement and Testing Technology,Shanghai 200233,China;National Centre of Quality Supervision&Inspection on Gold-Silver Products(Nanjing),Nanjing Institute of Product Quality Inspection,Nanjing 210018)

机构地区：[1]国家金银制品质量监督检验中心(上海),上海市计量测试技术研究院,上海200233 [2]国家金银制品质量监督检验中心(南京),南京市产品质量监督检验院,南京210018

出　　处：《贵金属》2018年第A01期185-187,共3页Precious Metals

摘　　要：采用X射线荧光显微仪和X射线荧光镀层测厚仪,以及K值计算法,对银饰品中银含量、镍覆盖层厚度和样品总厚度进行检测研究。银含量检测的结果与国家标准溴化钾容量法(电位滴定法)(GB/T 17832-2008)的检测结果吻合。X-ray fluorescence microscope analyzer and X-ray coating thickness meter were used to study on testing of silver content,nickel coating thickness and jeweler thickness of silver jeweler.Among those,K value calculated method was applied to obtain the results of silver contents,which were almost equal to the results by national standard volumetric(potentionmetric)method using potassium bromide(GB/T 17832-2008).

关 键 词：分析化学 X射线荧光法 银饰品 覆盖层厚度 样品总厚度 

分 类 号：TS934.3[轻工技术与工程] O657.34[理学—分析化学]