LuYAP∶Ce闪烁晶体阵列研究  

Study on LuYAP∶Ce Scintillation Crystal Array

作　　者：徐扬[1] 董鸿林 石自彬[1] 李德辉[1] 吴玉池 付昌禄[1] XU Yang;DONG Honglin;SHI Zibin;LI Dehui;WU Yuchi;FU Changlu(The 26th Research Institute of China Electronics Technology Group Corporation,Chongqing 400060,China;Laser Fusion Research Center,Mianyang 621000,China)

机构地区：[1]中国电子科技集团公司第二十六研究所,重庆400060 [2]激光聚变研究中心,四川绵阳621000

出　　处：《压电与声光》2019年第2期185-187,共3页Piezoelectrics & Acoustooptics

基　　金：国防科工局配套基金资助项目(JPPT-125-5-169)

摘　　要：铝酸钇镥(LuYAP)∶Ce晶体具有衰减时间短,密度大,光产额高及不潮解等优点。采用该晶体制作的闪烁晶体阵列,能快速获得皮秒级正电子湮灭的精确信息。该文报道了一种LuYAP∶Ce闪烁晶体阵列的制作方法,将提拉法制备的LuYAP∶Ce晶体经切割并运用化学机械抛光法处理后,最终利用填充材料制作了晶体阵列。在X线光机上开展了阵列的发光均匀性测试,测得发光不均匀性为14.8%。结果表明,LuYAP∶Ce晶体满足使用要求。LuYAP∶Ce crystal has the advantages of short decay time,high density,high light yield and non-deliquescence.The scintillation crystal arrays fabricated with this crystal can quickly obtain the accurate information of positron annihilation at picosecond level.A fabrication method of LuYAP∶Ce scintillating crystal array is presented in this paper.The LuYAP∶Ce crystal prepared by the Czochralski method is cut and polished by the chemical mechanical polishing,and a crystal array is finally fabricated by using the filling material.The luminance uniformity test of the array is carried out on the X-ray machine,and the luminance inhomogeneity is measured to be 14.8%,which satisfies the application requirements.

关 键 词：LuYAP∶Ce闪烁晶体 化学机械抛光 晶体阵列 发光均匀性 硫酸钡 

分 类 号：TN804[电子电信—信息与通信工程]