一种容忍单粒子双节点翻转的锁存器设计  

Design of a single event double node upset tolerant latch

作　　者：黄正峰[1] 张阳阳[1] 李雪健 付俊超 徐秀敏[1] 方祥圣[2] HUANG Zhengfeng;ZHANG Yangyang;LI Xuejian;FU Junchao;XU Xiumin;FANG Xiangsheng(School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei 230601, China;School of Computer and Information, Hefei University of Technology, Hefei 230601, China)

机构地区：[1]合肥工业大学电子科学与应用物理学院,安徽合肥230601 [2]合肥工业大学计算机与信息学院,安徽合肥230601

出　　处：《合肥工业大学学报（自然科学版）》2019年第4期493-499,共7页Journal of Hefei University of Technology：Natural Science

基　　金：国家自然科学基金资助项目(61574052);安徽省自然科学基金资助项目(1608085MF149);安徽行政学院科研团队资助项目(YJKT1417T01)

摘　　要：文章提出了一种新型的锁存器,采用双模冗余容错技术,能够同时容忍单粒子单节点翻转和单粒子双节点翻转。相比于同类型的加固设计,文中设计的结构延迟平均下降74.40%,功耗平均下降8.32%,功耗-延迟积(power-delay product,PDP)平均下降75.20%,面积平均减少15.76%;而且该锁存器的延迟对工艺、供电电压及温度的波动不敏感。In this paper, a novel latch is proposed, which can tolerate single event single node upset and single event double node upset by adopting dual modular redundancy fault-tolerance technique. The proposed latch achieves 74.40% reduction in delay, 8.32% reduction in power, 75.20% reduction in power-delay product(PDP) and 15.76% reduction in area on average, compared with the referred same kind of hardening latches. Moreover, its delay is insensitive to process, supply voltage and temperature variations.

关 键 词：软错误 单粒子翻转 单节点翻转 双节点翻转 加固锁存器 双模冗余 

分 类 号：TN432[电子电信—微电子学与固体电子学]