考虑关键故障的测试优化选择  

Optimized test selection method considering critical faults

作　　者：叶文 吕鑫燚 吕晓峰 马羚[1] YE Wen;L Xinyi;LV Xiaofeng;MA Ling(Coastal Defense College, Naval Aviation University, Yantai 264001, China;School of Electronic Information, Northwestern Polytechnic University, Xi’an 710072, China)

机构地区：[1]海军航空大学岸防兵学院,山东烟台264001 [2]西北工业大学电子信息学院,陕西西安710072

出　　处：《系统工程与电子技术》2019年第7期1583-1589,共7页Systems Engineering and Electronics

摘　　要：针对现有测试优化选择方法中因关键故障为小概率故障而容易被漏检的问题,提出了一种有指向性的对关键故障进行有效检测和隔离的方法。首先从系统安全性角度,分析了关键故障的重要性。然后基于相关性矩阵,以测试代价最小为优化目标,以故障检测率与隔离率和关键故障检测率与隔离率为约束,建立了考虑关键故障的测试优化选择模型,最后采用基于质心改进和惯性权重自适应调整的二进制粒子群算法进行求解。仿真实验结果表明,考虑关键故障的测试优化选择方法可以有效消除因关键故障漏检而对装备安全造成的严重威胁。A method of detecting and isolating critical faults is proposed, which is based on the problem that the critical fault is easy to be missed due to the small probability fault in the traditional test optimization method. First, from the perspective of system security, the importance of critical faults is analyzed. Then, based on the fault-test dependency matrix, an optimal test selection model taking critical fault detection rate and critical fault isolation rate into account is proposed. The optimization target is minimization of cost of selected tests. The constraints of the model involve fault detection rate and fault isolation rate of system. The binary particle swarm optimization algorithm based on centroid, whose inertia weight is adjusted based on population diversity, is used to solve the optimization model. The simulation results show that the optimization method of considering critical faults can effectively eliminate the serious threat to the safety of the equipment due to the missing of critical faults.

关 键 词：测试性设计 测试选择 关键故障 质心 二进制粒子群算法 

分 类 号：TP301.6[自动化与计算机技术—计算机系统结构]