某设备典型功能的BIT设计分析  

BIT Design Analysis of Typical Functions of an Equipment

作　　者：孙思琦 王春辉[1,2] 吴栋 雷东鹏[1,2] SUN Si-qi;WANG Chun-hui;WU Dong;LEI Dong-peng(The Fifth Electronics Research Institute of Ministry of Industry and Information Technology, Guangzhou,510610;Guangdong Province Key Laboratory of Electronic Information Products Reliability Technology,Guangzhou 510610)

机构地区：[1]工业和信息化部电子第五研究所,广州510610 [2]广东省电子信息产品可靠性技术重点实验室,广州510610

出　　处：《环境技术》2019年第A02期70-74,88,共6页Environmental Technology

摘　　要：设备测试性设计的目标是对设备进行性能监测、故障检测、故障隔离、虚警抑制等,使设备能及时、准确地反应其状态信息,其中BIT设计是目前设备测试性设计的主要内容。本文主要介绍了系统测试性设计方法及某设备典型功能电路BIT设计原理,为设备在研制阶段的测试性设计提供参考。The goal of equipment testability design is to perform performance monitoring, fault detection, fault isolation, false alarm suppression, etc., so that the equipment can reflect its status information in a timely and accurate manner. The BIT design is the main content of the current equipment testability design. This paper mainly introduces the testability design method of system and the BITdesign principle of typical function circuit of anequipment, which provides reference for the testability design of equipment in the development stage.

关 键 词：测试性设计 诊断设计 BIT设计 虚警 

分 类 号：TB64[一般工业技术—制冷工程]