TSVs串扰故障分组测试和诊断策略  

TSVs crosstalk fault grouping test and diagnostic strategy

作　　者：王秀云 刘军[1,2] 任福继[2,3] WANG Xiu-yun;LIU Jun;REN Fu-ji(School of Computer and Information,Hefei University of Technology,Hefei 230009,China;Anhui Province Key Laboratory of Affective Computing and Advanced Intelligent Machine,Hefei University of Technology,Hefei 230009,China;Department of Information Science&Intelligent Systems,Faculty of Engineering,The University of Tokushima,Tokushima 7708502,Japan)

机构地区：[1]合肥工业大学计算机与信息学院,安徽合肥230009 [2]合肥工业大学情感计算与先进智能机器安徽省重点实验室,安徽合肥230009 [3]德岛大学工学院智能信息系,日本德岛7708502

出　　处：《微电子学与计算机》2020年第2期30-36,共7页Microelectronics & Computer

基　　金：国家自然科学基金(61432004,61306049,61474035)。

摘　　要：TSVs串扰故障的测试和诊断对提高集成电路成品率有重要影响。为了减少TSVs测试和诊断时间,并且减少测试电路的面积开销,提出在信号接收端重用扫描单元的测试架构对TSVs串扰故障进行分组测试和诊断的新方案.该方案首先使用提出的TSVs分组算法,根据TSVs之间串扰影响距离,应用邻接矩阵求极大独立集对TSVs进行快速分组,使得每组内的TSVs不会发生串扰故障,并且最大化同组中TSVs的数量.分组完成后,使用提出的测试架构对同组内的TSVs进行并行测试,并且根据TSVs的测试响应,可以进一步诊断故障TSVs.实验结果表明,所提测试方案有效地减少了测试和诊断时间,并且减少了面积开销.Testing and diagnosis of TSVs crosstalk faults has an important impact on improving the yield of integrated circuits. In order to reduce TSVs testing and diagnostic time,and reduce the area overhead of the test circuit, a new scheme for group testing and diagnosis of TSVs crosstalk faults using a test architecture of the unilateral scan chain is proposed.The scheme firstly divides the TSVs into several groups according to the crosstalk influence distance between TSVs by the algorithm for finding the largest independent set in an adjacency matrix, so that the TSVs in each group do not have crosstalk faults and maximize TSVs in the same group.After grouping,the TSVs in the same group are tested and diagnosed in parallel using the proposed test architecture, and the faulty TSVs can be further diagnosed according to the test response of the TSVs. The experimental results show that the proposed test scheme effectively reduces the test and diagnosis time,and reduces the area overhead.

关 键 词：TSVs 串扰 集成电路 成品率 扫描链 

分 类 号：TP391[自动化与计算机技术—计算机应用技术]