利用KFM探究半导体量子点载流子分布实验设计  

Experimental design of carrier distribution in semiconductor quantum dots by KFM

作　　者：许杰 李金泽 白刚 XU Jie;LI Jinze;BAI Gang(College of Electronic and Optical Engineering,Nanjing University of Posts and Telecommunications,Nanjing 210023,China)

机构地区：[1]南京邮电大学电子与光学工程学院,江苏南京210023

出　　处：《实验技术与管理》2020年第3期53-55,59,共4页Experimental Technology and Management

基　　金：国家自然科学基金项目(61804080);江苏省自然科学基金项目(BK20160909)。

摘　　要：为了使学生在微观尺度下观察和探究量子点中的载流子浓度分布特性,设计了基于开尔文力显微镜(KFM)的探究性实验。实验内容包括试样准备、KFM测试、数字信号处理和结果与讨论。根据半导体物理知识计算出量子点中的载流子浓度分布情况。该实验有助于加深学生对量子点材料的理解,激发学生的学习兴趣,锻炼学生的创新能力。In order to enable students to observe and explore the distribution characteristics of carrier concentration in quantum dots on a micro scale, an exploratory experiment based on the Kelvin force microscope(KFM) is designed. The experimental contents include the sample preparation, KFM test, digital signal processing, results and discussion. The distribution of carrier concentration in quantum dots is calculated according to semiconductor physics knowledge. This experiment is helpful to deepen students’ understanding of quantum dot materials, stimulate their interest in learning and train their innovation ability.

关 键 词：载流子浓度 KFM 探究性实验 半导体量子点 

分 类 号：O471.1[理学—半导体物理]